DocumentCode
1966209
Title
(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems
Author
Barragan, Manuel J. ; Huertas, Gloria ; Rueda, Adoración ; Huertas, José L.
Author_Institution
Centro Nat. de Microelectron., Univ. de Sevilla, Sevilla, Spain
fYear
2010
fDate
13-15 Jan. 2010
Firstpage
8
Lastpage
13
Abstract
This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex integrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality.
Keywords
built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; RF part; analog part; built-in-self-test; complex heterogeneous integrated systems; complex integrated systems; mixed-signal integrated circuit; test quality; Baseband; Built-in self-test; Circuit testing; Electronic equipment testing; Integrated circuit technology; Life estimation; Radio frequency; Signal processing; System testing; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Application, 2010. DELTA '10. Fifth IEEE International Symposium on
Conference_Location
Ho Chi Minh City
Print_ISBN
978-0-7695-3978-2
Electronic_ISBN
978-1-4244-6026-7
Type
conf
DOI
10.1109/DELTA.2010.67
Filename
5438720
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