DocumentCode
1966232
Title
Digital test program re-hosting considerations and applications
Author
Truebenbach, Eric L.
Author_Institution
Teradyne Inc., North Reading
fYear
2007
fDate
17-20 Sept. 2007
Firstpage
89
Lastpage
96
Abstract
Military electronics enjoy the same advancement and improvements in technology that everyone has come to expect in commercial applications. But military electronics obsolesce much more slowly: instead of each upgrade replacing old technology every few years, each new design adds to the inventory of electronic systems that must be maintained and repaired. This paper examines the problem of upgrading digital test system technology, while both maintaining compatibility with older test programs and minimizing conversion cost. It draws upon experience transporting digital test programs across three generations of Teradyne digital test equipment. Specific attention is given to the design of the current fourth-generation digital test instrument. This instrument adds performance to keep pace with new designs, but also has features that were specifically introduced or retained to ease conversion of old test programs.
Keywords
military computing; military equipment; test equipment; digital test program re-hosting; military electronics; military test equipment; Computer architecture; Costs; Delay effects; Electronic equipment testing; Instruments; Pins; Pipelines; Software testing; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2007 IEEE
Conference_Location
Baltimore, MD
ISSN
1088-7725
Print_ISBN
978-1-4244-1239-6
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2007.4374206
Filename
4374206
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