• DocumentCode
    1966232
  • Title

    Digital test program re-hosting considerations and applications

  • Author

    Truebenbach, Eric L.

  • Author_Institution
    Teradyne Inc., North Reading
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    89
  • Lastpage
    96
  • Abstract
    Military electronics enjoy the same advancement and improvements in technology that everyone has come to expect in commercial applications. But military electronics obsolesce much more slowly: instead of each upgrade replacing old technology every few years, each new design adds to the inventory of electronic systems that must be maintained and repaired. This paper examines the problem of upgrading digital test system technology, while both maintaining compatibility with older test programs and minimizing conversion cost. It draws upon experience transporting digital test programs across three generations of Teradyne digital test equipment. Specific attention is given to the design of the current fourth-generation digital test instrument. This instrument adds performance to keep pace with new designs, but also has features that were specifically introduced or retained to ease conversion of old test programs.
  • Keywords
    military computing; military equipment; test equipment; digital test program re-hosting; military electronics; military test equipment; Computer architecture; Costs; Delay effects; Electronic equipment testing; Instruments; Pins; Pipelines; Software testing; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374206
  • Filename
    4374206