Title :
Digital test program re-hosting considerations and applications
Author :
Truebenbach, Eric L.
Author_Institution :
Teradyne Inc., North Reading
Abstract :
Military electronics enjoy the same advancement and improvements in technology that everyone has come to expect in commercial applications. But military electronics obsolesce much more slowly: instead of each upgrade replacing old technology every few years, each new design adds to the inventory of electronic systems that must be maintained and repaired. This paper examines the problem of upgrading digital test system technology, while both maintaining compatibility with older test programs and minimizing conversion cost. It draws upon experience transporting digital test programs across three generations of Teradyne digital test equipment. Specific attention is given to the design of the current fourth-generation digital test instrument. This instrument adds performance to keep pace with new designs, but also has features that were specifically introduced or retained to ease conversion of old test programs.
Keywords :
military computing; military equipment; test equipment; digital test program re-hosting; military electronics; military test equipment; Computer architecture; Costs; Delay effects; Electronic equipment testing; Instruments; Pins; Pipelines; Software testing; System testing; Test equipment;
Conference_Titel :
Autotestcon, 2007 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-1239-6
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2007.4374206