Title :
The automated generation of test cases using an extended domain based reliability model
Author :
Avritzer, Alberto ; Weyuker, Elaine J.
Author_Institution :
Siemens Corp. Res., Princeton, NJ
Abstract :
We present a new approach for the automated generation of test cases to be used for demonstrating the reliability of large industrial mission-critical systems. In this paper we extend earlier work by adding failure tracking and transient Markov chain analysis. Results from the transient Markov chain analysis are used to estimate the software reliability at a given system execution time.
Keywords :
Markov processes; automatic test pattern generation; failure analysis; industries; reliability; automated generation; extended domain; failure tracking; large industrial mission-critical systems; reliability model; software reliability; test cases; transient Markov chain analysis; Automatic testing; Life estimation; Mission critical systems; Navigation; Probability; Software reliability; Statistical analysis; System testing; Transient analysis; Unified modeling language;
Conference_Titel :
Automation of Software Test, 2009. AST '09. ICSE Workshop on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-3711-5
DOI :
10.1109/IWAST.2009.5069040
