DocumentCode
1966254
Title
The automated generation of test cases using an extended domain based reliability model
Author
Avritzer, Alberto ; Weyuker, Elaine J.
Author_Institution
Siemens Corp. Res., Princeton, NJ
fYear
2009
fDate
18-19 May 2009
Firstpage
44
Lastpage
52
Abstract
We present a new approach for the automated generation of test cases to be used for demonstrating the reliability of large industrial mission-critical systems. In this paper we extend earlier work by adding failure tracking and transient Markov chain analysis. Results from the transient Markov chain analysis are used to estimate the software reliability at a given system execution time.
Keywords
Markov processes; automatic test pattern generation; failure analysis; industries; reliability; automated generation; extended domain; failure tracking; large industrial mission-critical systems; reliability model; software reliability; test cases; transient Markov chain analysis; Automatic testing; Life estimation; Mission critical systems; Navigation; Probability; Software reliability; Statistical analysis; System testing; Transient analysis; Unified modeling language;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation of Software Test, 2009. AST '09. ICSE Workshop on
Conference_Location
Vancouver, BC
Print_ISBN
978-1-4244-3711-5
Type
conf
DOI
10.1109/IWAST.2009.5069040
Filename
5069040
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