Title :
Common adapter/fixture extraction techniques: sensitivities to calibration anomalies
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
fDate :
Nov. 30 2009-Dec. 4 2009
Abstract :
Many techniques exist for adapter/fixture extraction and handling non-insertable devices. Four of these approaches (adapter removal, one-port unterminating, SOLR, and back-to-back divide-by-2) will be considered in terms of sensitivity to standards problems and accuracy impact of the adapter/fixture parameters themselves for a variety of DUT types. The relative sensitivities can sometimes be surprising due to the occasional subtle dependencies on specific standards and the interactions between terms.
Keywords :
S-parameters; calibration; DUT types; S-parameter; adapter extraction techniques; calibration; fixture extraction techniques; noninsertable devices; one-port unterminating; Calibration; Coaxial components; Coplanar waveguides; Data mining; Fixtures; Frequency; Impedance; Reflection; Scattering parameters; Switches; S-parameter; de-embedding; extraction; unterminating;
Conference_Titel :
Microwave Measurement Symposium, 2009 74th ARFTG
Conference_Location :
Broomfield, CO
Print_ISBN :
978-1-4244-5712-0
DOI :
10.1109/ARFTG74.2009.5439088