• DocumentCode
    1966401
  • Title

    ATML capabilities explained

  • Author

    Gorringe, Chris ; Lopes, Teresa ; Pleasant, Dan

  • Author_Institution
    EADS Test & Services (UK) Ltd., Wimborne
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    178
  • Lastpage
    189
  • Abstract
    This paper describes the major concepts of ATML Capabilities and how they are used to describe instrument performance and capabilities, using simple examples and use cases. The paper leads the user through a simple set of increasingly complex problems, at each step describing instrument and test system capabilities in a standard and reusable manner. The paper takes the form of a tutorial, posing and solving increasingly complex instrument description capabilities, with each step clearly explained and defined. Each step concentrates on a particular feature of the ATML capability standard, and each step shows how real world complex systems can be described though a methodical and consistent process. Finally the paper considers the impact that ATML capabilities could have on the test industry as a whole, and offers some real and tangible benefits that may be achieved by the adoption of ATML capabilities by the industry as a whole.
  • Keywords
    automatic test software; programming languages; ATML; automatic test mark up language; complex systems; instrument capabilities; instrument performance; test industry; Automatic testing; Instruments; Manufacturing industries; Resource management; Runtime; Signal generators; Signal mapping; Software testing; System testing; XML;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374218
  • Filename
    4374218