• DocumentCode
    1966402
  • Title

    Adaptive Random Test Case Generation for Combinatorial Testing

  • Author

    Huang, Rubing ; Xie, Xiaodong ; Chen, Tsong Yueh ; Lu, Yansheng

  • Author_Institution
    Coll. of Comput. Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    52
  • Lastpage
    61
  • Abstract
    Random testing (RT), a fundamental software testing technique, has been widely used in practice. Adaptive random testing (ART), an enhancement of RT, performs better than original RT in terms of fault detection capability. However, not much work has been done on effectiveness analysis of ART in the combinatorial test spaces. In this paper, we propose a novel family of ART-based algorithms for generating combinatorial test suites, mainly based on fixed-size-candidate-set ART and restricted random testing (that is, ART by exclusion). We use an empirical approach to compare the effectiveness of test sets obtained by our proposed methods and random selection strategy. Experimental data demonstrate that the ART-based tests cover all possible combinations at a given strength more quickly than randomly chosen tests, and often detect more failures earlier and with fewer test cases in simulations.
  • Keywords
    fault diagnosis; program testing; ART-based algorithms; adaptive random test case generation; combinatorial test spaces; combinatorial test suite generation; combinatorial testing; empirical approach; fault detection capability; fixed-size-candidate-set ART; random selection strategy; restricted random testing; software testing technique; Educational institutions; Power capacitors; Software; Software testing; Subspace constraints; USA Councils; Software testing; adaptive random testing; combinatorial testing; random testing; restricted random testing; uncovered t-wise combinations distance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference (COMPSAC), 2012 IEEE 36th Annual
  • Conference_Location
    Izmir
  • ISSN
    0730-3157
  • Print_ISBN
    978-1-4673-1990-4
  • Electronic_ISBN
    0730-3157
  • Type

    conf

  • DOI
    10.1109/COMPSAC.2012.15
  • Filename
    6340123