• DocumentCode
    1966404
  • Title

    An adaptive fuzzy thresholding algorithm for exon prediction

  • Author

    Agrawal, Ankit ; Mittal, Ankush ; Jain, Rahul ; Takkar, Raghav

  • Author_Institution
    Dept. of Comput. Sci., Iowa State Univ., Ames, IA
  • fYear
    2008
  • fDate
    18-20 May 2008
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    Thresholding is always critical and decisive in problem solving. In this paper, we propose an adaptive fuzzy logic-based approach to thresholding for exon prediction problem, which is an important problem in bioinformatics. Rather than using the same threshold for the entire dataset, we allow the thresholds to vary along the dataset based on the local statistical properties. We incorporate it in a soft computing framework of training and testing to determine the optimum adaptive thresholds. The search space of the trained database is reduced by determining a dynamic range of thresholds using fuzzy logic rules, which makes our approach faster. To test our approach, we applied the proposed algorithm on a particular solution to the exon prediction problem, which uses a threshold on the frequency component at f = 1/3 in the nucleotide sequences. Preliminary experiments on the nucleotide data of Saccharomyces Cerevisiae (Bakers yeast) illustrate the potential of our approach. The adaptive thresholding approach gave suitable thresholds to detect the exons which were otherwise difficult to detect using a traditional static thresholding scheme.
  • Keywords
    biology computing; fuzzy set theory; molecular biophysics; proteins; Bakers yeast; Saccharomyces Cerevisiae; adaptive fuzzy thresholding algorithm; bioinformatics; exon prediction; fuzzy logic rules; nucleotide sequence; protein-coding regions; soft computing framework; Bioinformatics; Computer science; Databases; Frequency; Fungi; Fuzzy logic; Prediction algorithms; Sequences; Signal to noise ratio; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
  • Conference_Location
    Ames, IA
  • Print_ISBN
    978-1-4244-2029-2
  • Electronic_ISBN
    978-1-4244-2030-8
  • Type

    conf

  • DOI
    10.1109/EIT.2008.4554298
  • Filename
    4554298