A proposed comprehensive architecture utilizing the automatic test markup language (IEEE 1671 and 1636.1)

The automatic test markup language (ATML) framework and associated XML schemas have been in development for several years. With the exception of TestResults, which is being developed as part of SIMICA, these schemas are being formalized as IEEE 1671. These schemas provide a structured approach to allow most aspects of automatic test system data to be expressed in XML. If test instrument suppliers, test station integrators and end-item equipment manufacturers adopt these schemas for use in describing the capabilities and requirements for their products, it becomes possible to design a modular automated test system with loose coupling between system components. This paper explores a concept for one such system.