• DocumentCode
    1966431
  • Title

    Applications of IEEE P1671.1 ATML test description

  • Author

    Neag, Ion A. ; Seavey, Mike

  • Author_Institution
    Reston Software, Reston
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    197
  • Lastpage
    204
  • Abstract
    The emerging ATML test description standard (IEEE P1671.1) defines an XML-based format for describing automated test programs. This paper contains an overview of the ATML test description format, provides insight into its design, and suggests a number of applications that have the potential to improve development and maintenance processes for automated test programs.
  • Keywords
    IEEE standards; XML; automatic test software; ATML test description; IEEE P1671.1; XML-based format; automated test programs; development process; maintenance process; Aerospace testing; Application software; Automatic testing; Computer languages; Documentation; Electronic equipment testing; Signal processing; Software testing; System testing; XML;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374220
  • Filename
    4374220
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1966431