DocumentCode
1966694
Title
Vapor HF sacrificial etching for phosphorus doped polycrystalline silicon membrane structures
Author
Cao, Haibo ; Weber, Robert J.
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA
fYear
2008
fDate
18-20 May 2008
Firstpage
289
Lastpage
293
Abstract
In this work we present a technique using HF vapor to release phosphorus doped polycrystalline silicon (Phos-Poly) circular membrane structures. A 2 um thick annealed phosphosilicate glass (PSG) has been used as the sacrificial layer. The sacrificial etching was followed by solvent rinses and Critical Point Drying (CPD) to remove any residual HF and to avoid sticition. A Phos-Poly diaphragm with a diameter of 106 um has been successfully released as well as some membrane arrays. This technique has been proved very simple and effective. The membrane structures can be used in pressure sensing applications.
Keywords
annealing; elemental semiconductors; etching; microsensors; phosphorus; phosphosilicate glasses; pressure sensors; silicon; solvent effects; P2O5-SiO2; Phos-Poly diaphragm; Si:P; annealing; critical point drying; phosphorus doped polycrystalline silicon membrane structures; phosphosilicate glass; pressure sensing applications; size 106 mum; size 2 mum; solvent effect; vapor HF sacrificial etching; Annealing; Biomembranes; Electrodes; Etching; Glass; Hafnium; Mechanical factors; Mechanical sensors; Micromechanical devices; Silicon; HF Vapor; MEMS; pressure sensor; sacrificial etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
Conference_Location
Ames, IA
Print_ISBN
978-1-4244-2029-2
Electronic_ISBN
978-1-4244-2030-8
Type
conf
DOI
10.1109/EIT.2008.4554316
Filename
4554316
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