• DocumentCode
    1966694
  • Title

    Vapor HF sacrificial etching for phosphorus doped polycrystalline silicon membrane structures

  • Author

    Cao, Haibo ; Weber, Robert J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA
  • fYear
    2008
  • fDate
    18-20 May 2008
  • Firstpage
    289
  • Lastpage
    293
  • Abstract
    In this work we present a technique using HF vapor to release phosphorus doped polycrystalline silicon (Phos-Poly) circular membrane structures. A 2 um thick annealed phosphosilicate glass (PSG) has been used as the sacrificial layer. The sacrificial etching was followed by solvent rinses and Critical Point Drying (CPD) to remove any residual HF and to avoid sticition. A Phos-Poly diaphragm with a diameter of 106 um has been successfully released as well as some membrane arrays. This technique has been proved very simple and effective. The membrane structures can be used in pressure sensing applications.
  • Keywords
    annealing; elemental semiconductors; etching; microsensors; phosphorus; phosphosilicate glasses; pressure sensors; silicon; solvent effects; P2O5-SiO2; Phos-Poly diaphragm; Si:P; annealing; critical point drying; phosphorus doped polycrystalline silicon membrane structures; phosphosilicate glass; pressure sensing applications; size 106 mum; size 2 mum; solvent effect; vapor HF sacrificial etching; Annealing; Biomembranes; Electrodes; Etching; Glass; Hafnium; Mechanical factors; Mechanical sensors; Micromechanical devices; Silicon; HF Vapor; MEMS; pressure sensor; sacrificial etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
  • Conference_Location
    Ames, IA
  • Print_ISBN
    978-1-4244-2029-2
  • Electronic_ISBN
    978-1-4244-2030-8
  • Type

    conf

  • DOI
    10.1109/EIT.2008.4554316
  • Filename
    4554316