• DocumentCode
    1966711
  • Title

    Reliability and efficiency of electrical ground support equipment through automation, modularization, and standardization

  • Author

    Nguyen, Hien D. ; Miller, Iain A.

  • Author_Institution
    Johns Hopkins Univ., Baltimore
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    311
  • Lastpage
    320
  • Abstract
    The Johns Hopkins University Applied Physics Laboratory (APL) has been successfully designing and building spacecraft for decades. APL´s success is due in part to a desire to seek further efficiencies and reliability in all aspects of development without compromising the quality of the end product. One area where efficiency and reliability are paramount is the integration and test (l&T) phase of spacecraft development. During this stage, any problem or issue can severely impact the program schedule and cost. A necessary component of the l&T campaign is the electrical ground support equipment (EGSE). Composed of both hardware and software, the EGSE allows the l&T team to test and verify the spacecraft on the ground. As part of the continuing effort to enhance reliability and efficiency, some level of automation has been incorporated into testing involving EGSE. In this paper we will present the current testing and automation methods and associated enabling technologies and provide insight into future EGSE enhancements, including modularization and standardization, that can further increase system reliability and efficiency.
  • Keywords
    aerospace computing; aerospace testing; ground support equipment; reliability; space vehicles; standardisation; Johns Hopkins University Applied Physics Laboratory; automation; electrical ground support equipment; integration and test phase; modularization; spacecraft development; standardization; system efficiency; system reliability; Automatic testing; Automation; Buildings; Costs; Ground support; Hardware; Laboratories; Physics; Space vehicles; Standardization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374235
  • Filename
    4374235