• DocumentCode
    1966794
  • Title

    The effect of granularity level on software defect prediction

  • Author

    Calikli, Gul ; Tosun, Ayse ; Bener, Ayse ; Celik, Melih

  • Author_Institution
    Dept. of Comput. Eng., Bogazici Univ., Istanbul, Turkey
  • fYear
    2009
  • fDate
    14-16 Sept. 2009
  • Firstpage
    531
  • Lastpage
    536
  • Abstract
    Application of defect predictors in software development helps the managers to allocate their resources such as time and effort more efficiently and cost effectively to test certain sections of the code. In this research, we have used naive Bayes classifier (NBC) to construct our defect prediction framework. Our proposed framework uses the hierarchical structure information about the source code of the software product, to perform defect prediction at a functional method level and source file level. We have applied our model on SoftLAB and Eclipse datasets. We have measured the performance of our proposed model and applied cost benefit analysis. Our results reveal that source file level defect prediction improves the verification effort, while decreasing the defect prediction performance in all datasets.
  • Keywords
    pattern classification; program testing; program verification; Eclipse dataset; SoftLAB dataset; cost benefit analysis; functional method level; granularity level; naive Bayes classifier; software defect prediction; software development; source file level; static code attributes; Cost benefit analysis; Data mining; Engineering management; Laboratories; Programming; Research and development management; Resource management; Software development management; Software performance; Software testing; Naïve Bayes Classifier; component; cost-benefit analysis; defect prediciton; static code attributes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Sciences, 2009. ISCIS 2009. 24th International Symposium on
  • Conference_Location
    Guzelyurt
  • Print_ISBN
    978-1-4244-5021-3
  • Electronic_ISBN
    978-1-4244-5023-7
  • Type

    conf

  • DOI
    10.1109/ISCIS.2009.5291866
  • Filename
    5291866