Title :
82 GHz dynamic frequency divider in 5.5 ps ECL SiGe HBTs
Author :
Washio, K. ; Ohue, E. ; Oda, K. ; Hayami, R. ; Tanabe, M. ; Shimamoto, H. ; Harada, T. ; Kondo, M.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
A dynamic frequency divider with 82.4 GHz maximum operating frequency, the fastest reported in any semiconductor technology, and a static frequency divider with 60 GHz maximum operating frequency, the fastest reported in Si, are intended for future millimeter-wave systems. These frequency dividers are fabricated in self-aligned selective-epitaxial-growth (SEG) SiGe heterojunction bipolar transistors (HBTs). These SiGe HBTs provide a 122 GHz cutoff frequency, a 163 GHz maximum oscillation frequency, and 5.5 ps ECL gate delay, the fastest reported in Si.
Keywords :
Ge-Si alloys; bipolar integrated circuits; emitter-coupled logic; frequency dividers; heterojunction bipolar transistors; semiconductor materials; 5.5 ps; 82 GHz; ECL SiGe HBT; SiGe; dynamic frequency divider; millimeter-wave system; self-aligned selective epitaxial growth; semiconductor technology; Cutoff frequency; Frequency conversion; Germanium silicon alloys; Heterojunction bipolar transistors; Millimeter wave radar; Millimeter wave technology; Millimeter wave transistors; Radio spectrum management; Silicon germanium; Vehicle dynamics;
Conference_Titel :
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5853-8
DOI :
10.1109/ISSCC.2000.839753