DocumentCode :
1966862
Title :
A 0.5-V data-storage circuit for triple-threshold MTCMOS/SIMOX LSIs
Author :
Douseki, T. ; Harada, M.
Author_Institution :
NTT Syst. Electron. Labs., Kanagawa, Japan
fYear :
1998
fDate :
5-8 Oct. 1998
Firstpage :
117
Lastpage :
118
Abstract :
Summary form only given. 0.5 V CMOS circuit technology on ultra-thin-film SOI provides low-voltage operation without any sacrifice of speed, making it the most effective candidate for ultra-low-power applications in future ULSIs. We have proposed various multi-threshold CMOS/SIMOX (MTCMOS/SIMOX) circuits (Douseki et al. 1996; Fujii et al, 1998) that operate at an ultra-low supply voltage of less than 0.5 V. A triple-V/sub th/ MTCMOS/SIMOX circuit, which combines fully-depleted low- and medium-V/sub th/ CMOS logic gates and partially-depleted high-V/sub th/ power-switch transistors, makes possible fast operation in the active mode and leakage current reduction in both active and sleep modes. An advantage of the circuit is that all combinational logic gates in the conventional CMOS circuit can be easily replaced. However, upon replacing the sequential circuits, there are cases when an additional data-storage circuit is needed in order to store data in the sleep mode. The additional circuit in the critical path affects the speed in the active mode. In this paper, we describe a data-storage circuit that has the additional medium-V/sub th/ circuit in the noncritical path and does not result in any loss of speed.
Keywords :
CMOS logic circuits; CMOS memory circuits; SIMOX; ULSI; combinational circuits; integrated circuit design; logic design; logic gates; sequential circuits; 0.5 V; CMOS circuit; CMOS circuit technology; MTCMOS/SIMOX LSIs; Si-SiO/sub 2/; ULSIs; active mode operating speed; circuit critical path; circuit noncritical path; combinational logic gates; data-storage circuit; fully-depleted low threshold CMOS logic gates; fully-depleted medium threshold CMOS logic gates; leakage current reduction; low-voltage operation; multi-threshold CMOS/SIMOX circuits; partially-depleted high threshold power-switch transistors; sequential circuits; sleep mode; sleep mode data storage; triple-threshold CMOS/SIMOX LSIs; ultra-low supply voltage; ultra-thin-film SOI; CMOS logic circuits; CMOS technology; Feedback circuits; Feedback loop; Frequency; Inverters; Large scale integration; Latches; MOSFET circuits; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1998. Proceedings., 1998 IEEE International
Conference_Location :
Stuart, FL, USA
ISSN :
1078-621X
Print_ISBN :
0-7803-4500-2
Type :
conf
DOI :
10.1109/SOI.1998.723139
Filename :
723139
Link To Document :
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