Title :
Threshold cancelling logic (TCL): a post-CMOS logic family scalable down to 0.02 /spl mu/m
Author :
Kohno, I. ; Sano, T. ; Katoh, N. ; Yano, K.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
Simple refrigeration of room-temperature-optimized CMOS devices does not enable low-voltage operation, because threshold voltage is higher at low temperatures. It might be possible to optimize threshold voltage for low-temperatures, but low-temperature-optimized CMOS suffers from a high leakage current at room temperature. This makes testing of the LSIs difficult. Burn-in testing with high temperature acceleration of feature modes would be particularly difficult because of the thermal runaway characteristics of the subthreshold current. This post-CMOS circuit family, threshold cancelling logic (TCL), can be scaled down to 0.02 /spl mu/m, corresponding to three generations smaller than conventional CMOS circuits.
Keywords :
CMOS logic circuits; cryogenic electronics; large scale integration; threshold logic; 0.02 micron; CMOS circuit; LSI; low temperature operation; subthreshold leakage current; threshold cancelling logic; threshold voltage; Adders; CMOS logic circuits; Circuit simulation; Circuit testing; Delay; Electron devices; Leakage current; MOSFETs; Temperature; Threshold voltage;
Conference_Titel :
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5853-8
DOI :
10.1109/ISSCC.2000.839756