Title :
Delay variability: sources, impacts and trends
Author_Institution :
IBM Corp., Austin, TX, USA
Abstract :
The electrical performance of an integrated circuit is impacted by (a) environmental factors which include variations in power supply voltage and temperature, and(b) physical factors caused by processing and mask imperfections. Only the physical sources of variability, denoted P, are dealt with. P includes device and wire model parameters such as V/sub th/, T/sub ox/ and R/sub s/.
Keywords :
delays; integrated circuit design; integrated circuit modelling; masks; wiring; IC design; delay variability; device model parameters; mask imperfections; physical factors; processing imperfections; wire model parameters; Circuit noise; Circuit simulation; Delay; Environmental factors; Power supplies; Semiconductor device modeling; Semiconductor device noise; Temperature; Voltage; Wire;
Conference_Titel :
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5853-8
DOI :
10.1109/ISSCC.2000.839819
