Title :
Performance Limits of Practical Low Noise, High Stability Gunn Oscillators
Author :
Kerzar, Boris ; Weissglas, Peter
Author_Institution :
Microwave Institute Foundation, Fack, S-100 44 Stockholm, Sweden
Keywords :
Circuit noise; Circuit stability; Diodes; Frequency; Gunn devices; Low-frequency noise; Noise measurement; Oscillators; Thermal expansion; Voltage;
Conference_Titel :
Microwave Conference, 1976. 6th European
Conference_Location :
Rome, Italy
DOI :
10.1109/EUMA.1976.332294
