Title :
A 660 MHz self-resetting 8 port, 32/spl times/64 bits register file and latch in 0.25 /spl mu/m SOI technology
Author :
Joshi, R.V. ; Hwang, Wei ; Henkels, W.H. ; Wilson, S. ; Rausch, W. ; Shahidi, G.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Design issues associated with dynamic circuits such as collisions, pulse widening, and noise margins are anticipated to be very sensitive to SOI process and device conditions. Multi-port dynamic register files and latches are important elements in current microprocessors. We designed such a register file and latch for bulk silicon technology, but it can be fabricated in SOI technology without any body contacts. The register file and latch function at frequencies higher than 660 MHz. The salient features are low voltage operability, fully collision-free operation and minimum noise. A robust design is demonstrated with respect to input pulse width variation and skew margins. Charge sharing noise and noise due to leakage coupling and power supply variations are controlled using half latches on the dynamic nodes and by properly optimizing circuits and layouts.
Keywords :
circuit optimisation; flip-flops; integrated circuit design; integrated circuit noise; integrated circuit testing; leakage currents; logic design; logic testing; microprocessor chips; shift registers; silicon-on-insulator; 0.25 micron; 32 bit; 64 bit; 660 MHz; SOI device conditions; SOI process conditions; SOI technology; Si-SiO/sub 2/; body contacts; charge sharing noise; circuit layout optimization; circuit optimization; dynamic circuit collisions; dynamic circuit design; dynamic latches; dynamic node half-latches; fully collision-free operation; input pulse width variation; leakage coupling noise; low voltage operability; microprocessors; minimum noise; multi-port dynamic register files; noise margins; power supply variation noise; pulse widening; self-resetting latch; self-resetting register file; skew margins; Circuit noise; Frequency; Latches; Low voltage; Microprocessors; Noise robustness; Pulse circuits; Registers; Silicon; Space vector pulse width modulation;
Conference_Titel :
SOI Conference, 1998. Proceedings., 1998 IEEE International
Conference_Location :
Stuart, FL, USA
Print_ISBN :
0-7803-4500-2
DOI :
10.1109/SOI.1998.723146