DocumentCode
1968528
Title
Investigation of a SPR waveguide sensor based on angular interrogation
Author
Fan, Shiqi ; Li, Mingyu ; He, Jian-Jun
Author_Institution
Center for Integrated Optoelectron., Zhejiang Univ., Hangzhou, China
fYear
2010
fDate
8-12 Dec. 2010
Firstpage
471
Lastpage
472
Abstract
A novel angular interrogation SPR waveguide sensor based on SOI material is theoretically investigated. The parameters of the sensor such as the thickness of Au and Ti film are optimized.
Keywords
optical waveguides; silicon-on-insulator; SPR; angular interrogation; waveguide sensor; Coatings; Films; Gold; Optical waveguides; Reflection; Waveguide theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications and Photonics Conference and Exhibition (ACP), 2010 Asia
Conference_Location
Shanghai
Print_ISBN
978-1-4244-7111-9
Type
conf
DOI
10.1109/ACP.2010.5682583
Filename
5682583
Link To Document