DocumentCode
1970679
Title
Frequency and Temperature Dependence Measurements of Complex Permittivity of Dielectric Rods Using Some TM0m0 Modes in a Circular Cavity
Author
Kobayashi, Yoshio ; Nakai, Hiroshi ; Suzuki, Fumio ; Ma, Zhewang
Author_Institution
Saitama Univ., Saitama
fYear
2007
fDate
11-14 Dec. 2007
Firstpage
1
Lastpage
4
Abstract
This paper, at first, discuss the availability of a cavity resonance method using the resonance frequencies of some TM0m0 modes in a circular cavity to measure the frequency dependence of a dielectric rod sample. The influence of sample insertion holes to the measurement are estimated accurately on the basis of the rigorous analysis by the Ritz-Galerkin method. Some dielectric rod samples were measured by using two modes TM010 and TM020 hi each of two cavities with different heights. The measurement precision for the relative permittivity was improved within 0.3 %, compared with 3 to 7 % in the perturbation method. Then one of the cavities was set in an environmental test equipment and the temperature dependences of dielectric rod samples were measured. As a result, the present method is useful to measure the frequency and temperature dependences of dielectric rod samples.
Keywords
Galerkin method; cavity resonators; permittivity measurement; Ritz-Galerkin method; circular cavity; complex permittivity; dielectric rod samples; environmental test equipment; frequency-temperature dependence measurements; insertion holes; Dielectric measurements; Frequency dependence; Frequency measurement; Permittivity measurement; Perturbation methods; Resonance; Resonant frequency; Temperature dependence; Temperature measurement; Test equipment; Complex Permittivity Measurement; Perturbation Method; Temperature Dependent; component;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2007. APMC 2007. Asia-Pacific
Conference_Location
Bangkok
Print_ISBN
978-1-4244-0748-4
Electronic_ISBN
978-1-4244-0749-1
Type
conf
DOI
10.1109/APMC.2007.4554536
Filename
4554536
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