DocumentCode

1970682

Title

2D analysis of gate polydepletion in ultra short MOSFETs

Author

Josse, E. ; Skotnicki, T.

Author_Institution

STMicroelectronics, Crolles, France

fYear

2001

fDate

11-13 September 2001

Firstpage

207

Lastpage

210

Keywords

MOSFETs;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2001. Proceeding of the 31st European

Print_ISBN

2-914601-01-8

Type

conf

DOI

10.1109/ESSDERC.2001.195237

Filename

1506619