Title :
Accurate Simulation of Substrate Currents by Accounting for the Hot Electron Tail Population
Author :
Grasser, Tibor ; Kosina, Hans ; Gritsch, Markus ; Selberherr, Siegfried ; Puchner, Helmut ; Aronowitz, Sheldon
Author_Institution :
Technical University Vienna, Austria
fDate :
11-13 September 2001
Keywords :
Current measurement; Distribution functions; Electrons; Geometry; Impact ionization; MOSFETs; Predictive models; Probability distribution; Solid modeling; Tail;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195239
