DocumentCode
1970906
Title
A Comparison Between 20:1 and 5:1 Doping Ratios for High Efficiency X-Band GaAs IMPATT Diodes
Author
Huish, P.W.
Author_Institution
PO Research Centre, Martlesham Heath, Ipswich, Suffolk, IP5 7RE England
fYear
1977
fDate
5-8 Sept. 1977
Firstpage
487
Lastpage
491
Abstract
High efficiency X-band GaAs IMPATT diodes with doping ratios of 20:1 and 5:1 are compared using hybrid coaxial-waveguide circuits. Both doping ratios yield diodes which show a factor of two increase in output power and efficiency when compared with similar uniformly doped diodes. Arrays of diodes are used to obtain output powers up to 5W. The increase in output power is almost linearly related to the number of diodes forming the array. Measurements of the AMand FM noise of representative diodes show that no significant noise penalty is incurred by using either doping ratio. The more difficult fabrication technology associated with the 20:1 doping ratio is not commensurate with the increase in RF performance, and a lower doping ratio can be used to equal effect.
Keywords
Circuits; Coaxial components; Diodes; Doping; Fabrication; Gallium arsenide; Noise measurement; Power generation; Radio frequency; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1977. 7th European
Conference_Location
Copenhagen, Denmark
Type
conf
DOI
10.1109/EUMA.1977.332472
Filename
4131121
Link To Document