DocumentCode
1970917
Title
Temperature and Humidity Measuring of a New Development Box Based on Expert PID
Author
Ma Jiwei ; Lin Zhipeng ; Gao Jianli ; Ma Jimei ; Lin Hongju ; Liu Shiguang
Author_Institution
Coll. of Mech. & Electr. Eng., Hebei Normal Univ. of Sci. & Technol., Qinhuangdao, China
fYear
2010
fDate
22-23 June 2010
Firstpage
432
Lastpage
435
Abstract
This paper focuses on the hardware and software design method of a new type of high efficient temperature and humidity testing cabinet. As the hardware core is based on the STC12C5616AD MCU, the entire hardware system is simpler and more reliable. By using sectional measurement of temperature and humidity, adopting expert PID control algorithm and using hardware and software compensation measures, the system dynamic and static quality and control precision is further improved. The system cabinet with a unique inner and outer double-loop structure improves the system efficiency and energy saving effect. Furthermore, the use of touch screen as input and output device, which is simpler to operate and more eye-catching, meets the different needs of consumers.
Keywords
control engineering computing; hardware-software codesign; humidity control; microcontrollers; temperature control; three-term control; touch sensitive screens; STC12C5616AD MCU; development box; double loop structure; expert PID control algorithm; hardware design method; humidity testing cabinet; software design method; temperature measurement; touch screen; Hardware; Humidity; Humidity measurement; Temperature control; Temperature measurement; Temperature sensors; STC12C5616AD; expert PID; sectional measurement; temperature and humidity; testing cabinet;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Computing and Cognitive Informatics (ICICCI), 2010 International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-6640-5
Electronic_ISBN
978-1-4244-6641-2
Type
conf
DOI
10.1109/ICICCI.2010.98
Filename
5565940
Link To Document