Title :
N-Well Engineering to Improve Soft-Error-Rate Immunity for P-Type Substrate SRAM Technologies
Author :
Puchner, H. ; Liu, Y.-C. ; Kong, W. ; Duan, F. ; Castagnetti, R.
Author_Institution :
LSI Logic Corporation, Santa Clara, USA
fDate :
11-13 September 2001
Keywords :
Alpha particles; CMOS logic circuits; CMOS technology; Doping; Implants; Large scale integration; Random access memory; Single event upset; Substrates; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195259
