• DocumentCode
    1971814
  • Title

    Electromagnetically induced transparency-enhanced conversion efficiency of coherent VUV generation in krypton

  • Author

    Dorman, C. ; Marangos, J.P.

  • Author_Institution
    Blackett Lab., Imperial Coll. of Sci., Technol. & Med., London, UK
  • fYear
    1998
  • fDate
    8-8 May 1998
  • Firstpage
    203
  • Lastpage
    204
  • Abstract
    Summary form only given.Resonant sum-difference frequency mixing has been investigated in krypton. A two-photon resonant field tuned to 212.55 nm drove transitions between the ground state and the excited state. This excited state was coupled by a near-resonant field at 759 nm. The infrared coupling field was near transform limited and under these conditions should result in electromagnetically induced transparency (EIT) at the frequency of the generated VUV field (123.6 nm). The predicted enhancement in the conversion efficiency of the scheme was investigated by studying the dependence of the VUV signal on intensity and detuning of the coupling field.
  • Keywords
    X-ray production; krypton; light sources; optical frequency conversion; optical tuning; resonant states; transparency; two-photon processes; 123.6 nm; 212.55 nm; Kr; coherent VUV generation; coupling field detuning; electromagnetically induced transparency; electromagnetically induced transparency-enhanced conversion efficiency; excited state; generated VUV field frequency; ground state; infrared coupling field; krypton; near transform limited; near-resonant field; resonant sum-difference frequency mixing; two-photon resonant field tuning; Atom lasers; Atom optics; Atomic beams; Atomic measurements; Biomedical optical imaging; Laser theory; Laser transitions; Laser tuning; Nonlinear optics; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-541-2
  • Type

    conf

  • DOI
    10.1109/IQEC.1998.680413
  • Filename
    680413