DocumentCode
1971863
Title
Micro-machined dielectrically isolated (MMDI) wafer technology [SOI]
Author
Cantarini, W. ; Lizotte, S. ; Ahmed, S.
Author_Institution
Int. Rectifier Corp., El Segundo, CA, USA
fYear
1998
fDate
5-8 Oct. 1998
Firstpage
173
Lastpage
174
Abstract
This paper describes a new economical alternative to costly bonded silicon-on-insulator (BSOI) wafers in which dielectrically isolated wafers are fabricated from single bulk silicon wafers. Initial processing involves trench etching through a single wafer to a predefined depth using micro-machining tools. The trenches are filled with an insulator to provide lateral dielectric isolation. Standard semiconductor processing is performed. The back side of the silicon is then removed to at least the level of the bottom of the trenches, and an insulating oxide is deposited on the back surface. We call this new technology micro-machined dielectric isolation (MMDI). This new technology reduces the cost of producing DI wafers by over 30% compared to BSOI technology, due to the reduction in the materials and the processing steps. Opto-electronic devices have been fabricated using MMDI technology with yields, performance, and reliability comparable to devices fabricated using the standard BSOI production process.
Keywords
etching; isolation technology; micromachining; oxidation; semiconductor device reliability; silicon-on-insulator; BSOI technology; DI wafer production cost; MMDI technology; MMDI technology performance; MMDI technology reliability; MMDI technology yield; MMDI wafer technology; Si-SiO/sub 2/; backside silicon removal; bonded silicon-on-insulator wafers; dielectrically isolated wafers; insulating oxide back surface deposition; insulator trench filling; lateral dielectric isolation; micro-machined dielectric isolation; micro-machined dielectrically isolated SOI wafer technology; micro-machining tools; opto-electronic devices; single bulk silicon wafers; standard semiconductor processing; trench etching; trench etching depth; Dielectrics and electrical insulation; Etching; Histograms; Integrated circuit yield; Isolation technology; Optoelectronic devices; Passivation; Rectifiers; Relays; Silicon on insulator technology;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1998. Proceedings., 1998 IEEE International
Conference_Location
Stuart, FL, USA
ISSN
1078-621X
Print_ISBN
0-7803-4500-2
Type
conf
DOI
10.1109/SOI.1998.723167
Filename
723167
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