DocumentCode

1971920

Title

Relevance of Gate Current for the Functionality of Deep Submicron CMOS Circuits

Author

Schwantes, Stefan ; Krautschneider, Wolfgang

Author_Institution

Technical University Hamburg-Harburg, Germany

fYear

2001

fDate

11-13 September 2001

Firstpage

471

Lastpage

474

Keywords

Analytical models; Circuit simulation; Electrodes; Equations; Fluctuations; MOSFETs; Region 4; TV; Transconductance; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2001. Proceeding of the 31st European

Print_ISBN

2-914601-01-8

Type

conf

DOI

10.1109/ESSDERC.2001.195303

Filename

1506685