• DocumentCode
    1971940
  • Title

    Keynote address: Will reliability limit Moore´s law?

  • Author

    Oates, Tony

  • Author_Institution
    TSMC 168 Park Avenue 2, Hsinchu Science Park, 30844, Hsinchu, Taiwan
  • fYear
    2013
  • fDate
    13-17 Oct. 2013
  • Abstract
    Moore´s law continues to be the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore´s law. In this talk we will discuss reliability issues that can most directly impact the industry´s capability to maintain the pace of technology progression required by Moore´s law.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
  • Conference_Location
    South Lake Tahoe, CA, USA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4799-0350-4
  • Type

    conf

  • DOI
    10.1109/IIRW.2013.6804135
  • Filename
    6804135