DocumentCode
1972102
Title
Modelling the Current Density and Resistance of Interconnect Vias
Author
Reeves, G.K. ; Holland, A.S. ; Leech, P.W.
Author_Institution
RMIT, Melbourne, Australia
fYear
2001
fDate
11-13 September 2001
Firstpage
503
Lastpage
506
Keywords
Australia; Conductivity; Copper; Current density; Electric resistance; Finite element methods; Integrated circuit interconnections; Plugs; Ultra large scale integration; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN
2-914601-01-8
Type
conf
DOI
10.1109/ESSDERC.2001.195311
Filename
1506693
Link To Document