DocumentCode
1972250
Title
Estimation of the characteristic curve and the wavelength in high-brightness LED
Author
Valencia, Juan-Sebastián Botero ; Giraldo, Francisco-Eugenio López
Author_Institution
Autom. & Electron. Group, Inst. Tecnol. Metropolitano, Medellin, Colombia
fYear
2012
fDate
12-14 Sept. 2012
Firstpage
132
Lastpage
134
Abstract
LED technology (Light Emitting Diode) has achieved increasing prominence in the development of new sensing systems, lighting and communications. The reduction in manufacturing costs has made it possible to increase their use and the search for new applications. However, the technical information is difficult to associate with devices that are available in the market and equipment necessary to characterize them can significantly increase the cost of a project. This scholarship was obtained current vs. voltage curve (characteristic curve) in 5 high-brightness LED using a system of signal generation and acquisition purpose built with a low cost microcontroller. Additionally using a low cost spectrometer was obtained wavelength. With the data obtained and the Planck model, we found the fitting parameters needed to estimate the emission wavelength of an LED according to the point of intersection with the voltage axis of the linear region of the LED. Finally, the model has found it possible to use the wavelength with a relative error less than (3.16)% counting only with voltage and current data that can be obtained easily.
Keywords
light emitting diodes; microcontrollers; sensors; signal generators; LED linear region; Planck model; characteristic curve estimation; current data; fitting parameters; high-brightness LED technology; high-brightness light emitting diode technology; low cost microcontroller; low cost spectrometer; manufacturing costs; sensing systems; signal acquisition system; signal generation system; voltage axis; voltage curve; voltage data; wavelength estimation; Approximation methods; Calibration; Image color analysis; Light emitting diodes; Mathematical model; Microcontrollers; Wavelength measurement; Characteristic curve; LED (Light Emitting Diode); Planck; microcontroller; spectrometry; wavelength;
fLanguage
English
Publisher
ieee
Conference_Titel
Image, Signal Processing, and Artificial Vision (STSIVA), 2012 XVII Symposium of
Conference_Location
Antioquia
Print_ISBN
978-1-4673-2759-6
Type
conf
DOI
10.1109/STSIVA.2012.6340570
Filename
6340570
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