• DocumentCode
    1972314
  • Title

    Classifying eye and head movement artifacts in EEG signals

  • Author

    Chadwick, Neisha A. ; McMeekin, David A. ; Tan, Tele

  • Author_Institution
    Digital Ecosyst. & Bus. Intell. Inst. (DEBII), Curtin Univ., Perth, WA, Australia
  • fYear
    2011
  • fDate
    May 31 2011-June 3 2011
  • Firstpage
    285
  • Lastpage
    291
  • Abstract
    Brain Computer Interfaces has some exciting prospects such as controlling devices at the speed of thought. However BCI technology is far from attaining this goal. A significant challenge the EEG-based system has is the interference of artifacts in the EEG generated by eye and head movement. This paper presents the use of machine learning techniques to classify artifacts in the EEG. Successful artifact classification was then be applied to improve existing artifact removal techniques. The experiment used a state-of-the-art EEG system to gather the classifier input. An eye tracker and motion sensor were also used to measure and provide the ground truth for the classification experiments. The data from these devices were captured using custom built software developed for this research. The classifiers tested showed potential to classify artifacts in the EEG when trained on a per-person basis. This research paves the way for further work to be carried out to explore subject-independent artifact classification.
  • Keywords
    brain-computer interfaces; electroencephalography; learning (artificial intelligence); medical signal processing; BCI technology; EEG signal; brain computer interface; custom-built software; eye movement artifact; eye tracker; head movement artifact; machine learning; motion sensor; Decision trees; Electroencephalography; Electrooculography; Head; Hidden Markov models; Magnetic heads; Tracking; classifiers; classifying; eeg artifacts; eye movement; head movement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital Ecosystems and Technologies Conference (DEST), 2011 Proceedings of the 5th IEEE International Conference on
  • Conference_Location
    Daejeon
  • Print_ISBN
    978-1-4577-0871-8
  • Type

    conf

  • DOI
    10.1109/DEST.2011.5936640
  • Filename
    5936640