Title :
A Study of Gate/Source-terminated Field-Plate NMOS Transistors and Its application in Switch Design
Author :
Wei, Chien-Cheng ; Lin, Shao-Wei ; Chiu, Hsien-Chin ; Feng, Wu-Shiung
Author_Institution :
Electron. Eng., Chang Gung Univ., Taoyuan
Abstract :
We have systematically studied the microwave noise, power, and linearity characteristics of field-plate (FP) 0.13-mum CMOS transistors in which the field-plate are separately connected to the gate and source terminals. The gate-terminated FP NMOS (FP-G NMOS) provided the best minimum noise figure (NFmin) at 6 GHz compared to standard device and source- terminated FP device (FP-S NMOS) owing to the lowest gate resistance (Rg) can be obtained in this structure. By adopting FP metal in NMOS, both FP-S and FP-G devices achieved higher current density at high gate bias voltages; besides, they also demonstrated higher efficiency under high drain-to-source voltages at high input power swing. The third-order inter- modulation product (IM3) is -39.4 dB for FP-S NMOS for Pin=-20 dBm; the corresponding values for FP-G and standard devices are -34.9 and -37.3 dB, respectively. These experimental results indicated that the FP-G architecture is suitable for low noise applications and FP-S is more effective at high power and high linearity operation. Finally, a 24 GHz T/R switch was designed and fabricated by using FP-S NMOSs for achieving good ability of isolation and harmonics rejection ratio.
Keywords :
CMOS integrated circuits; semiconductor switches; CMOS transistors; frequency 6 GHz; gate terminated FP NMOS; gate/source terminated field plate; harmonics rejection ratio; linearity characteristics; microwave noise; minimum noise figure; power characteristics; switch design; Current density; Linearity; MOS devices; MOSFETs; Microwave devices; Microwave transistors; Noise figure; Noise measurement; Switches; Voltage; NFmin; NMOS; T/R switch; field-plate; linearity;
Conference_Titel :
Microwave Conference, 2007. APMC 2007. Asia-Pacific
Conference_Location :
Bangkok
Print_ISBN :
978-1-4244-0748-4
Electronic_ISBN :
978-1-4244-0749-1
DOI :
10.1109/APMC.2007.4554630