• DocumentCode
    1973154
  • Title

    Characterization of multiconductor inhomogeneous uniformly coupled lines from TDR data

  • Author

    Tripathi, Alok ; Tripathi, V.K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
  • fYear
    1997
  • fDate
    27-29 Oct. 1997
  • Firstpage
    167
  • Lastpage
    170
  • Abstract
    An algorithm to extract the normal mode parameters of uniformly coupled lines in an inhomogeneous medium is developed. The sufficiency of the measured multiport time domain reflection coefficient matrix elements in extracting all the normal mode parameters is exemplified with the example of typical coupled lines system.
  • Keywords
    eigenvalues and eigenfunctions; microstrip lines; multiport networks; time-domain reflectometry; TDR data; multiconductor inhomogeneous medium; multiport time domain analysis; normal mode parameters; reflection coefficient matrix elements; uniformly coupled lines; Admittance; Coupling circuits; Data mining; Delay; Eigenvalues and eigenfunctions; Impedance; Null space; Reflection; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1997., IEEE 6th Topical Meeting on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-8649-3
  • Type

    conf

  • DOI
    10.1109/EPEP.1997.634063
  • Filename
    634063
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1973154