Title :
Characterization of multiconductor inhomogeneous uniformly coupled lines from TDR data
Author :
Tripathi, Alok ; Tripathi, V.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Abstract :
An algorithm to extract the normal mode parameters of uniformly coupled lines in an inhomogeneous medium is developed. The sufficiency of the measured multiport time domain reflection coefficient matrix elements in extracting all the normal mode parameters is exemplified with the example of typical coupled lines system.
Keywords :
eigenvalues and eigenfunctions; microstrip lines; multiport networks; time-domain reflectometry; TDR data; multiconductor inhomogeneous medium; multiport time domain analysis; normal mode parameters; reflection coefficient matrix elements; uniformly coupled lines; Admittance; Coupling circuits; Data mining; Delay; Eigenvalues and eigenfunctions; Impedance; Null space; Reflection; Time measurement; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1997., IEEE 6th Topical Meeting on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-8649-3
DOI :
10.1109/EPEP.1997.634063
