• DocumentCode
    1973445
  • Title

    Signal processing for the guided wave test based on the empirical mode decomposition

  • Author

    Xu, Jiang ; Xiong, Hongfen ; Wu, Xinjun

  • Author_Institution
    Key Lab. of Nondestructive Testing, Nanchang Hangkong Univ., Nanchang, China
  • fYear
    2011
  • fDate
    16-18 Sept. 2011
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    In order to detect the small defect, the empirical mode decomposition (EMD) method is employed to process the magnetostrictive guided wave testing signal. Firstly, the principle of the EMD is introduced. Then, the experimental setup is developed to obtain guided wave testing signals. Both the prestressing strand and the parallel wire cable have been manufactured grooves in the wires. It is difficult to find the defect signal from the original signal. By means of the EMD, the test signal is decomposed into series of the intrinsic mode functions (IMFs). The small defect signal is enhanced by analyzing the different order of the IMF. It is easy to find the small defect signal in the first mode wave for the prestressing strand. For the parallel wire cables, the second and third mode can be used to find the small defect signal. These test results indicate that the EMD approach can suppress noise effectively and improve the ability of guided wave testing of the small defect.
  • Keywords
    cables (electric); magnetostriction; nondestructive testing; signal processing; EMD; IMF; empirical mode decomposition; guided wave testing signals; intrinsic mode functions; magnetostrictive guided wave testing signal; nondestructive testing technology; parallel wire cable; signal processing; Acoustics; Magnetostriction; Noise; Reflection; Steel; Testing; Wires; empirical mode decomposition; guided wave; intrinsic mode function; nondestructive testing; signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Control Engineering (ICECE), 2011 International Conference on
  • Conference_Location
    Yichang
  • Print_ISBN
    978-1-4244-8162-0
  • Type

    conf

  • DOI
    10.1109/ICECENG.2011.6057057
  • Filename
    6057057