Title :
Fast bunch-to-bunch current sampling in the Cornell electron-positron collider
Author :
Dunnam, C.R. ; Unser, K.B.
Author_Institution :
Lab. of Nucl. Studies, Cornell Univ., Ithaca, NY, USA
Abstract :
Preliminary studies of a high resolution Cornell Electron-positron Storage Ring (CESR) bunch-to-bunch signal processing system are described. In these studies, a prototype inductive-integrating, sampling current monitor is evaluated for improved estimation of bunch lifetimes over a series of planned CESR luminosity upgrades. Initial test data indicate significant performance advantages over conventional electrostatic pickup systems in the areas of linearity, dynamic range and beam position sensitivity. Novel features of the fast bunch current monitor include its wideband passive integrating pickup, diplex filter section and high resolution bunch signal processor (BSP). Evaluation studies in CESR indicate this fast bunch monitor is potentially useful in colliders and other storage rings utilizing bunch-to-bunch or bunch train separations down to 80 nanoseconds. Proposed system revisions to permit fast, high resolution bunch train current measurements in future CESR operations are discussed. Commercial availability of several principal bunch-to-bunch current monitor components is noted
Keywords :
beam handling equipment; beam handling techniques; electron accelerators; particle beam diagnostics; signal processing; storage rings; CESR; CESR luminosity upgrades; Cornell electron-positron collider; beam position sensitivity; bunch lifetime estimation; bunch train separations; bunch-to-bunch signal processing system; diplex filter section; electrostatic pickup systems; fast bunch current monitor; fast bunch monitor; fast bunch-to-bunch current sampling; high resolution Cornell Electron-positron Storage Ring; high resolution bunch signal processor; prototype inductive-integrating sampling current monitor; wideband passive integrating pickup; Life estimation; Lifetime estimation; Monitoring; Prototypes; Sampling methods; Signal processing; Signal resolution; Signal sampling; Storage rings; System testing;
Conference_Titel :
Particle Accelerator Conference, 1993., Proceedings of the 1993
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-1203-1
DOI :
10.1109/PAC.1993.309333