• DocumentCode
    1973822
  • Title

    Applications of full-field swept-source optical coherence tomography for non-destructive testing and evaluation

  • Author

    Mehta, Dalip Singh

  • Author_Institution
    Instrum. Design Dev. Centre, Indian Inst. of Technol. Delhi, New Delhi, India
  • fYear
    2009
  • fDate
    30-3 Aug. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We report applications of full-field swept-source optical coherence tomography (SS-OCT) for non-destructive testing and evaluation. Results of topography and tomography of latent fingerprints, silicon microelectronic circuits and composite materials are presented. The system is completely non-mechanical scanning, compact and low-cost.
  • Keywords
    nondestructive testing; optical tomography; composite materials; fingerprints tomography; fingerprints topography; full-field swept-source optical coherence tomography; nondestructive evaluation; nondestructive testing; nonmechanical scanning; silicon microelectronic circuits; Biomedical optical imaging; Fingerprint recognition; Frequency; Holographic optical components; Nondestructive testing; Optical filters; Optical imaging; Optical interferometry; Superluminescent diodes; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-3829-7
  • Electronic_ISBN
    978-1-4244-3830-3
  • Type

    conf

  • DOI
    10.1109/CLEOPR.2009.5292305
  • Filename
    5292305
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1973822