Title :
Applications of full-field swept-source optical coherence tomography for non-destructive testing and evaluation
Author :
Mehta, Dalip Singh
Author_Institution :
Instrum. Design Dev. Centre, Indian Inst. of Technol. Delhi, New Delhi, India
Abstract :
We report applications of full-field swept-source optical coherence tomography (SS-OCT) for non-destructive testing and evaluation. Results of topography and tomography of latent fingerprints, silicon microelectronic circuits and composite materials are presented. The system is completely non-mechanical scanning, compact and low-cost.
Keywords :
nondestructive testing; optical tomography; composite materials; fingerprints tomography; fingerprints topography; full-field swept-source optical coherence tomography; nondestructive evaluation; nondestructive testing; nonmechanical scanning; silicon microelectronic circuits; Biomedical optical imaging; Fingerprint recognition; Frequency; Holographic optical components; Nondestructive testing; Optical filters; Optical imaging; Optical interferometry; Superluminescent diodes; Tomography;
Conference_Titel :
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3829-7
Electronic_ISBN :
978-1-4244-3830-3
DOI :
10.1109/CLEOPR.2009.5292305
