• DocumentCode
    19745
  • Title

    MDS Product Code Performance Estimations Under Header CRC Check Failures and Missing Syncs

  • Author

    Arslan, Suayb S. ; Jaewook Lee ; Hodges, Jerry ; Peng, Junbiao ; Hoa Le ; Goker, Turguy

  • Author_Institution
    Adv. Dev. Lab., Quantum Corp., Irvine, CA, USA
  • Volume
    14
  • Issue
    3
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    921
  • Lastpage
    930
  • Abstract
    Data storage systems that use removable media heavily rely on strong concatenated error correction coding (ECC) architectures in order to guarantee very low target data loss rates. Particularly, tape drives and optical disk drives (e.g., CD, DVD, and BD) employ powerful ECC schemes based on a concatenation of an outer maximum distance separable (MDS) code called C2 and an inner MDS code called C1 in order to achieve this performance. In addition to data, these storage systems employ header and synchronization appends (i.e., sync patterns) for appropriate allocation of user information on the physical storage medium. Since headers and sync patterns are subject to channel errors as well, accurately retrieved data may be regarded useless if an error occurs in either of these fields. In order to predict very low target C2 failure rates (which is typically on the order of 10-17) in the presence of header and synchronization errors, we propose a semianalytical method in this paper that incorporates the effects of the header and synchronization errors in the output error rate expressions. We use our proposed model with linear tape open (LTO) data examples to both show the effectiveness of the estimation results and draw some interesting conclusions.
  • Keywords
    channel coding; concatenated codes; cyclic redundancy check codes; disc drives; error correction codes; linear codes; product codes; synchronisation; BD; CD; DVD; ECC architecture; LTO data; MDS product code performance estimation; concatenated error correction coding architecture; cyclic redundancy check code; data retrieval; data storage system; header CRC check failure; linear tape open data; maximum distance separable code; missing sync pattern; optical disk drive; output error rate expression; physical storage medium; semianalytical method; synchronization error; tape drive; Encoding; Error correction codes; Maximum likelihood decoding; Product codes; Reliability; Synchronization; Error-correcting codes; linear tape open (LTO); optical and magnetic recording; product codes; reliability;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2014.2345585
  • Filename
    6874518