DocumentCode
1974564
Title
Application of Inverted Strip Dielectric Waveguides for Measurement of Material Properties at Millimeter-Wave Frequencies
Author
Itoh, Tatsuo ; Hsu, Fwu-Jih
Author_Institution
Department of Electrical Engineering, The University of Texas, Austin, TX 78712
fYear
1978
fDate
4-8 Sept. 1978
Firstpage
823
Lastpage
827
Abstract
An entirely new method for measuring dielectric properties of slab type materials is developed by using a novel dielectric waveguide structure originally designed for millimeter-wave integrated circuits. The method entails the measurement of the stop-band of the grating structure created in the dielectric waveguide. Several examples of measurement results are reported.
Keywords
Dielectric materials; Dielectric measurements; Frequency measurement; Integrated circuit measurements; Material properties; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Slabs; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1978. 8th European
Conference_Location
Paris, France
Type
conf
DOI
10.1109/EUMA.1978.332629
Filename
4131309
Link To Document