DocumentCode :
1974597
Title :
Several issues on the designment of pulse electrical stress aging test device of insulation materials
Author :
Jiang, Cunbo ; Guo, Dong ; Jin, Hong ; Yan, Junbu ; Wang, Wei ; Zhang, Shenglan
Author_Institution :
Coll. of Inf. Sci. & Eng., Guilin Univ. of Technol., Guilin, China
fYear :
2011
fDate :
16-18 Sept. 2011
Firstpage :
362
Lastpage :
366
Abstract :
In order to meet the requirements of the lifespan test of insulating materials under pulsed electrical stress circumstances,a high-voltage high-frequency pulse power supply device of cascaded H-bridge with optical isolation was developed. After studying the pulse parameters with specimen, we should consider the pulse rise time in load condition but not overemphasize the pulse rise time in no-load condition when designing the experimental device. The methods to estimate pulse rise time of multi-mode cascaded H-bridge and pulse power capacity were proposed through analyzing. The experimental result shows that the method which uses to estimate the pulse rise time and power capacity is correct, and technical solutions proposed meets the needs of the accelerated aging test of insulating material under pulsed electrical stress circumstances insulation pulse electrical stress need.
Keywords :
ageing; bridge circuits; insulating materials; life testing; accelerated aging test; high-voltage high-frequency pulse power supply device; insulation materials; multimode cascaded H-bridge; optical isolation; power capacity; pulse electrical stress aging test device; Accelerated aging; Delay; Insulation; Inverters; Materials; Stress; H-bridge inverter; aging test; high-voltage pulse power; module cascade;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Control Engineering (ICECE), 2011 International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4244-8162-0
Type :
conf
DOI :
10.1109/ICECENG.2011.6057122
Filename :
6057122
Link To Document :
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