DocumentCode
1974609
Title
CMOS image sensors-recent advances and device scaling considerations
Author
Hon-Sum Philip Wong
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
1997
fDate
10-10 Dec. 1997
Firstpage
201
Lastpage
204
Abstract
This paper reviews the industry trend and the recent advances in CMOS image sensor technology, covering advances in technology, devices, pixel architecture, as well as on-chip circuit integration. Compatibility with "standard" CMOS technology is an important consideration for CMOS image sensors. We therefore explore the question: "will the image sensing performance of CMOS imagers get better or get worse as CMOS technologies are scaled?" We project that "standard" CMOS technologies cannot be used for imaging in the deep sub-micron regime without some process modifications.
Keywords
CMOS integrated circuits; image sensors; integrated circuit technology; CMOS image sensor technology; device scaling; on-chip circuit integration; pixel architecture; CMOS image sensors; CMOS logic circuits; CMOS process; CMOS technology; Charge coupled devices; Costs; Energy consumption; Image sensors; Low voltage; Pixel;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-4100-7
Type
conf
DOI
10.1109/IEDM.1997.650332
Filename
650332
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