• DocumentCode
    1975570
  • Title

    Noise performance of a color CMOS photogate image sensor

  • Author

    Blanksby, A.J. ; Loinaz, M.J. ; Inglis, D.A. ; Ackland, B.D.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
  • fYear
    1997
  • fDate
    10-10 Dec. 1997
  • Firstpage
    205
  • Lastpage
    208
  • Abstract
    We report on the noise performance of a color CMOS photogate image sensor that supports two levels of correlated double sampling and has high conversion gain at each pixel. Imager performance is limited by low quantum efficiency and dark current non-uniformity and not by read-out circuit temporal or fixed-pattern noise.
  • Keywords
    CMOS integrated circuits; image colour analysis; image sensors; integrated circuit noise; color CMOS photogate image sensor; correlated double sampling; dark current; fixed-pattern noise; pixel conversion gain; quantum efficiency; read-out circuit; temporal noise; CMOS image sensors; Circuit noise; Colored noise; Dark current; Image converters; Image sampling; Image sensors; Noise level; Performance gain; Pixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4100-7
  • Type

    conf

  • DOI
    10.1109/IEDM.1997.650337
  • Filename
    650337
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1975570