• DocumentCode
    1975626
  • Title

    Simulation and Behavior Evaluation of PT-IGBT Connections in Parallel Strings

  • Author

    Chimento, F. ; Nicosia, F. ; Musumeci, S. ; Raciti, A. ; Melito, M. ; Sorrcntino, G.

  • Author_Institution
    Univ. of Catania, Catania
  • fYear
    2007
  • fDate
    4-7 June 2007
  • Firstpage
    931
  • Lastpage
    936
  • Abstract
    The paper deals with the experimental evaluation of the electrical and thermal behaviors of punch-through IGBT in parallel connections. The influences of the electrical parameters on the current sharing are evaluated and discussed. The thermal behavior of several ICBT devices in parallel connections in different experimental conditions are evaluated and discussed. Furthermore some issues on the negative feedback contribution coming from the heat sink looking for the reduction of the current imbalance are analyzed in loaded conditions.
  • Keywords
    feedback; heat sinks; insulated gate bipolar transistors; power bipolar transistors; current imbalance; current sharing; electrical behavior; heat sink; negative feedback; parallel strings; punch-through IGBT connections; thermal behavior; Circuit simulation; Circuit testing; Current control; Heat sinks; Insulated gate bipolar transistors; Negative feedback; Production; Steady-state; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2007. ISIE 2007. IEEE International Symposium on
  • Conference_Location
    Vigo
  • Print_ISBN
    978-1-4244-0754-5
  • Type

    conf

  • DOI
    10.1109/ISIE.2007.4374722
  • Filename
    4374722