DocumentCode
1975681
Title
Verification of Surface Scattering Models and Inversion Algorithms with the Polarimetric Backscatter Measurements of a Bare Soil Surface
Author
Jung, Seung-Gun ; Hong, Jin-Young ; Oh, Yisok
Author_Institution
Dept. of Electron. Inf. & Commun. Eng., Hongik Univ., Seoul
fYear
2007
fDate
11-14 Dec. 2007
Firstpage
1
Lastpage
3
Abstract
The backscattering coefficients of a bare soil surface were measured using an L-band polarimetric scatterometer, which were used to verify the validities of scattering models and inversion algorithms. The soil moisture contents and surface roughness parameters (the RMS height and correlation length) were also measured from the soil surface. The backscattering coefficients of scattering models with these surface parameters were compared with the measured backscattering coefficients. The soil moisture contents of the soil surface were retrieved from the measured backscattering coefficients, and compared with the measured surface parameters. This paper shows that the scattering models agree with the measurements, and also shows the inversion results.
Keywords
backscatter; electromagnetic wave scattering; soil; surface electromagnetic waves; RMS height; bare soil surface; correlation length; inversion algorithms; polarimetric backscatter measurements; soil moisture contents; surface roughness parameters; surface scattering models; Backscatter; L-band; Length measurement; Moisture measurement; Radar measurements; Rough surfaces; Scattering; Soil measurements; Soil moisture; Surface roughness; Surface scattering model; bare soil surface; inversion algorithm; soil moisture content;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2007. APMC 2007. Asia-Pacific
Conference_Location
Bangkok
Print_ISBN
978-1-4244-0748-4
Electronic_ISBN
978-1-4244-0749-1
Type
conf
DOI
10.1109/APMC.2007.4554789
Filename
4554789
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