DocumentCode
1975922
Title
Discussion on testability distribution method for series-parallel connection
Author
Jin, Dan
Author_Institution
Naval Univ. of Eng., Wuhan, China
fYear
2011
fDate
16-18 Sept. 2011
Firstpage
2191
Lastpage
2193
Abstract
Aimed at the diversification of the distribution methods, the relationship is studied between system testability index and the system element testability indexes, and the factors are analyzed, which have influence on determining testability indexes. It introduces three methods including fault rate method, weighting method and analytic of hierarchy process (AHP) for series-parallel connection and gives an example to analyze these methods proving the practicability of fault rate method and AHP.
Keywords
decision making; joining processes; production equipment; testing; analytic hierarchy processing; fault rate method; series-parallel connection; system element testability index; system testability index; testability distribution method; weighting method; Educational institutions; Finite impulse response filter; Gallium nitride; Indexes; Manufacturing; Monitoring; Neodymium; analytic of hierarchy process; fault rate method; testability distribution; weighting method;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Control Engineering (ICECE), 2011 International Conference on
Conference_Location
Yichang
Print_ISBN
978-1-4244-8162-0
Type
conf
DOI
10.1109/ICECENG.2011.6057192
Filename
6057192
Link To Document