DocumentCode :
1975922
Title :
Discussion on testability distribution method for series-parallel connection
Author :
Jin, Dan
Author_Institution :
Naval Univ. of Eng., Wuhan, China
fYear :
2011
fDate :
16-18 Sept. 2011
Firstpage :
2191
Lastpage :
2193
Abstract :
Aimed at the diversification of the distribution methods, the relationship is studied between system testability index and the system element testability indexes, and the factors are analyzed, which have influence on determining testability indexes. It introduces three methods including fault rate method, weighting method and analytic of hierarchy process (AHP) for series-parallel connection and gives an example to analyze these methods proving the practicability of fault rate method and AHP.
Keywords :
decision making; joining processes; production equipment; testing; analytic hierarchy processing; fault rate method; series-parallel connection; system element testability index; system testability index; testability distribution method; weighting method; Educational institutions; Finite impulse response filter; Gallium nitride; Indexes; Manufacturing; Monitoring; Neodymium; analytic of hierarchy process; fault rate method; testability distribution; weighting method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Control Engineering (ICECE), 2011 International Conference on
Conference_Location :
Yichang
Print_ISBN :
978-1-4244-8162-0
Type :
conf
DOI :
10.1109/ICECENG.2011.6057192
Filename :
6057192
Link To Document :
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