• DocumentCode
    1976079
  • Title

    Compressing with Collapsible Tries

  • Author

    Apostolico, Alberto ; Choi, Yong Wook

  • Author_Institution
    IIC, College of Computing, Georgia Institute of Technology, 801 Atlantic Drive, Atlanta, GA 30318 - USA and DEI, Università di Padova, I-35100 Padova, Italy, Email: axa@cc.gatech.edu
  • fYear
    2006
  • fDate
    13-17 March 2006
  • Firstpage
    92
  • Lastpage
    96
  • Abstract
    Lossy variants of the Ziv-Lempel family of encoders are built traditionally around the iterated quest for best matches within an assigned fidelity. Most of the resulting algorithms are inherently superlinear and not easy to implement and analyze. On the other hand, it is well known that any lossy scheme of low computational complexity must have the drawback that it cannot yield the minimal distortion which can be achieved by the optimal data compression algorithm specifically tailored for that case. This paper concentrates on parses of guaranteed low time performance, in which phrases are all distinct and generated mechanically by self-correlations of the source set forth by the parsing process. The goal of the paper is to describe the basic algorithm and some of its variants, show their good performance and latitude of practical applicability, and possibly stimulate in-depth analytical treatment, which is made particularly hard by the fact that the underlying processes are not stationary.
  • Keywords
    Data Compression by Textual Substitution; Design and Analysis of Algorithms; Lossy Compression; Pattern Matching; Trie; Ziv-Lempel-Welch Phrase Parse; Algorithm design and analysis; Computational complexity; Data compression; Dictionaries; Distortion; Drives; Educational institutions; Encoding; Interpolation; Solids; Data Compression by Textual Substitution; Design and Analysis of Algorithms; Lossy Compression; Pattern Matching; Trie; Ziv-Lempel-Welch Phrase Parse;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Workshop, 2006. ITW '06 Punta del Este. IEEE
  • Conference_Location
    Punta del Este, Uruguay
  • Print_ISBN
    1-4244-0035-X
  • Electronic_ISBN
    1-4244-0036-8
  • Type

    conf

  • DOI
    10.1109/ITW.2006.1633788
  • Filename
    1633788