• DocumentCode
    1976090
  • Title

    Investigation on Tolerances of Substrate Integrated Waveguide (SIW)

  • Author

    Cheng, Yujian ; Hong, Wei ; Ke Wu

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Montreal, Montreal, QC
  • fYear
    2007
  • fDate
    11-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, the substrate integrated waveguide (SIW) is investigated into the effects of tolerances using the sensitivity approach. The changes in characteristics of transmission line due to the tolerances of its parameters have been analyzed to evaluate the worst case behavior. A set of sensitivity curves are given to help the design procedure and used to determine the tradeoff between performances and tolerances. The results from the present investigations have shed new light on design criteria. For instant, a low-impedance SIW is less sensitivity to tolerances in parameters and preferred to be chosen in consideration. The inverse problem is also studied to evaluate the required accuracies for the fabrications and substrates with a prescribed VSWR value. Computations for others conventional planar transmission lines are compared with the SIW, which have been demonstrated that an SIW transmission line is the less sensitive one.
  • Keywords
    inverse problems; planar waveguides; transmission line theory; SIW transmission line; VSWR value; conventional planar transmission lines; inverse problem; low-impedance SIW; sensitivity curves; substrate integrated waveguide; Dielectric substrates; Distributed parameter circuits; Fabrication; Frequency selective surfaces; Inverse problems; Millimeter wave integrated circuits; Millimeter wave technology; Planar transmission lines; Planar waveguides; Rectangular waveguides; sensitivity approach; substrate integrated waveguide (SIW); tolerance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2007. APMC 2007. Asia-Pacific
  • Conference_Location
    Bangkok
  • Print_ISBN
    978-1-4244-0748-4
  • Electronic_ISBN
    978-1-4244-0749-1
  • Type

    conf

  • DOI
    10.1109/APMC.2007.4554805
  • Filename
    4554805