• DocumentCode
    1976212
  • Title

    Image noise reduction by dynamic thresholding of correlated wavelet intensity and anisotropy

  • Author

    Huai, Xiaoning ; Lee, Kijong ; Kim, Chaesung

  • Author_Institution
    Syst. LSI/ Image Dev. Team, Samsung Electron., Suwon, South Korea
  • fYear
    2010
  • fDate
    22-23 Nov. 2010
  • Firstpage
    28
  • Lastpage
    33
  • Abstract
    A novel image noise reduction filter is developed in wavelet domain. The correlations of intensity and anisotropy of wavelet coefficients in different sub-bands and scales are utilized as features to separate signal from random noise. Dynamic thresholding is used to further increase the sensitivity and discrimination against different noise patterns and standard deviations. Simulation in Matlab is carried out by filtering an AWGN-added sub-set of test images from Kodak image data base and a standard digital Macbeth Color Chart. Average PSNR scores of R, G and B color channels are competitive to bilateral filter and a prominent commercial noise reduction tool Neat Image. In addition, the low computational complexity of threshold operation makes it applicable for low cost implementations in various imaging devices as a real time noise reduction module.
  • Keywords
    AWGN; computational complexity; correlation theory; filtering theory; image colour analysis; image denoising; random noise; real-time systems; wavelet transforms; AWGN-added sub-set; Kodak image data; Matlab; Neat Image; PSNR scores; bilateral filter; color channels; commercial noise reduction tool; computational complexity; correlated wavelet intensity; dynamic thresholding; filtering; image noise reduction filter; imaging devices; noise patterns; random noise; real time noise reduction module; standard deviations; standard digital Macbeth color chart; test images; wavelet anisotropy; wavelet coefficients; wavelet domain; Colored noise; Data models; Image color analysis; Noise reduction; PSNR; ISP; Image PSNR; Image SNR; dynamic thresholding; noise reduction; wavelet anisotropy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference (ISOCC), 2010 International
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-8633-5
  • Type

    conf

  • DOI
    10.1109/SOCDC.2010.5682982
  • Filename
    5682982