• DocumentCode
    1976648
  • Title

    Recent development of via models: Hybrid circuit and field analysis

  • Author

    Zhang, Yao-Jiang ; Fan, Jun

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2010
  • fDate
    7-9 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Via-plate interaction can be modeled as lumped circuits for vias and a two-dimensional field problem for the plate domain. The accuracy of the improved intrinsic via model and the conventional physics-based via model is investigated by comparing them with either analytical formula or numerical simulations for a via in a circular plate pair with various edge boundary conditions. It is found that the intrinsic via model matches very well with both the analytical formula and numerical solutions in all the examples studied. However, the physics-based via model is only an acceptable approximation at low frequencies and its accuracy is not dependent on the plate size but on the via itself. It is observed that the physics-based via model is more accurate for a plate par with smaller plate separations.
  • Keywords
    electronics packaging; numerical analysis; circular plate pair; edge boundary conditions; field analysis; hybrid circuit; lumped circuits; numerical simulations; physics-based via model; plate separations; via models; via-plate interaction; Accuracy; Analytical models; Boundary conditions; Impedance; Integrated circuit modeling; Numerical models; Probes; Hybrid circuit and field analysis; intrinsic via circuit model; physics-based via circuit model; via-plate interactions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
  • Conference_Location
    Singapore
  • ISSN
    2151-1225
  • Print_ISBN
    978-1-4244-9068-4
  • Electronic_ISBN
    2151-1225
  • Type

    conf

  • DOI
    10.1109/EDAPS.2010.5683001
  • Filename
    5683001