• DocumentCode
    1977062
  • Title

    Breakdown characteristics of CuCr Electrode after electron beam treatment and current conditioning treatment in vacuum

  • Author

    Asari, Naoki ; Sasaki, Yutaka ; Shioiri, Tetsu ; Sato, Jun ; Homma, Mitsutaka

  • Author_Institution
    Toshiba Corp, Fuchu, Japan
  • fYear
    2013
  • fDate
    20-23 Oct. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    For development of high-voltage equipment such as vacuum circuit breakers, it is very important to improve their dielectric breakdown characteristics in a vacuum. It is thus necessary to clarify the breakdown mechanism in a vacuum. It is well-known that these characteristics are influenced by the electrode material and its surface condition and the breakdown voltage is increased by current conditioning and electron beam irradiation [1] [2] [3] . This paper presents breakdown characteristics and observations of a cross-section after electron beam treatment and current conditioning treatment. The results are compared with those for only electron beam treatment and only current conditioning treatment. It is shown that the breakdown voltage of a CuCr electrode both treatments is higher than that achieved by only one of them. Treatment combining electron beam and current conditioning forms a CuCr layer with small Cr grains. The breakdown voltage after both these treatments is increased by the formation of this layer.
  • Keywords
    chromium alloys; copper alloys; electric breakdown; electrochemical electrodes; electron beam applications; vacuum circuit breakers; CuCr; breakdown voltage; current conditioning treatment; electrode material; electron beam irradiation; electron beam treatment; high-voltage equipment dielectric breakdown characteristics; surface condition; vacuum circuit breaker; Electrodes; Radiation effects; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Power Equipment - Switching Technology (ICEPE-ST), 2013 2nd International Conference on
  • Conference_Location
    Matsue
  • Type

    conf

  • DOI
    10.1109/ICEPE-ST.2013.6804374
  • Filename
    6804374